Used Metrology / Inspection (Semiconductors)

2001 KEITHLEY S475

• used

• Manufacturer: Keithley
• Model: S475

KEITHLEY, S425, Kerf Parametric Tester

2001 KEITHLEY S425

• used

• Manufacturer: Keithley
• Model: S425

KEITHLEY, S425, Kerf Parametric Tester Tool ID: K611X

2001 KEITHLEY S425

• used

• Manufacturer: Keithley
• Model: S425

KEITHLEY, S425, Kerf Parametric Tester Tool ID: K259

2001 KEITHLEY S475

• used

• Manufacturer: Keithley
• Model: S475

KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K268

CMI XRX-X4 X-Ray System

• used

• Manufacturer: CMI

System is Being Sold As-Is / Where-Is. Missing Computer & Software.

2011 KLA AMI2900

• used

• Manufacturer: KLA-Tencor
• Model: AMI2900

KLA AMI2900, 300mm KLA Advanced Macro Inspection Module Tool ID: AMI2900

HMI eP4 320

• used

• Manufacturer: HMI

HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle Tool ID: SEI24000

Keithley S425

• used

• Manufacturer: Keithley
• Model: S425

Keithley, S425, Kerf Parametric Tester

2001 KEITHLEY S475

• used

• Manufacturer: Keithley
• Model: S475

KEITHLEY, S425, Kerf Parametric Tester

2001 KEITHLEY S475

• used

• Manufacturer: Keithley
• Model: S475

KEITHLEY, S425, Kerf Parametric Tester

HSEB Axiospect 301

• used

• Manufacturer: HSEB

HSEB, Axiospect 301, Optical Microscope, 300mm Tool ID: OPI2900

2015 FEI ExSolve CLM next Gen, 300mm

• used

• Manufacturer: FEI

FEI, ExSolve CLM next Gen, 300mm, Tool ID: FIB2103

1990 KLA-Tencor P-1 Profiler

• used

• Manufacturer: KLA-Tencor
• Model: P-1

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

Veeco NT8000 contract Imaging Service

• used

• Manufacturer: Veeco - Sloan
• Model: NT8000

We have a former Vecco Development Engineer with 25 years experience in USA who can carry out your Imaging on his NT3300 or NT8800 on a contract hourly basis and issue you an analysis report We collect whatever...

Nanospec 8300 X Film Thickness Analyzer

• used

• Manufacturer: Nanospec