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Used Test & Measurement (Semiconductors) in New York, USA

  • LEO 1455 Scanning Electron Microscope

    LEO 1455 Scanning Electron Microscope (SEM)

    • used

    • Manufacturer: LEO Electron Microscopy

    LEO 1455 Scanning Electron Microscope Capable of handling a full 6in (150mm) wafer Tool unfortunately did not work well after receiving a software and PC upgrade. However, tool may work with some deeper investi...

    New York, USA