1996 BIO-RAD QS-408M
used
- Manufacturer: Bio-Rad
- Model: QS-408M
*. BIO-RAD FTIR QS-408. *. BPSG,EPI. *. Installed in Clean-room. *. Can demonstrate any time.
Cheonan-si, South Korea
BIO-RAD QS-1200
used
- Manufacturer: Bio-Rad
- Model: QS-1200
BIO-RAD FT-IR QS-1200 Spectrometer .FTS-175 Spectrometer - He-Ne Laser - IR Source - DTGS Detector - KBr Beam Splitter .Up to 12 Inch, Wafer Tray/Nose Cone .FTS Power Supply .Windows XP PC & LCD Monitor .EPI / BP...
Cheonan-si, South Korea
2004 N&K N&K 3700 RT
used
- Manufacturer: N&K
Broadband spectrometry for film thickness on transparent substrates, including photomask reticles. The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These...
Cheonan-si, South Korea
2002 NANOMETRICS Nanospec 9300
used
- Manufacturer: Nanometrics
- Model: Nanospec 9300
Currently 12" configured (It can be modified for 8" open cassette handling) Spectroscopic Reflectometer (SR) Two optical light sources Visable tungsten halogen lamp UV deuterium arc lamp Lens 4x,15x (Visible & UV...
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 386DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table.
Cheonan-si, South Korea
2012 KLA TENCOR Candeal 8620
used
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
2005 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
2006 KLA TENCOR OSA6100
used
- Manufacturer: KLA-Tencor
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Disk substrates
Cheonan-si, South Korea
N&K N&K 1700
used
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1996 NANOMETRICS 2100
used
- Manufacturer: Nanometrics
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
1995 KLA TENCOR P-10
used
- Manufacturer: KLA-Tencor
- Model: P-10
- Standard Head with L(yellow) type stylus. - Intel Pentium 233Mhz Ram:32MB , HDD: 2GB - Installed in Clean-room.
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 486DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table. - Installed in Clean-room. - Fully refurbished. - Can demonstrate any time.
Cheonan-si, South Korea
2001 NIKON NWL641M
used
- Manufacturer: Nikon
- Model: NWL641
IC Inspection Wafer Loader Orientation flat/notch detection
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
used
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
used
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
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