Used Rudolph Semiconductors

Rudolph Auto EL Elipsometer

• used

• Manufacturer: Rudolph
• Model: Auto EL

Rudolph Auto EL Elipsometer Wafer size: 150mm

1992 Rudolph FE III

• used

• Manufacturer: Rudolph
• Model: FE-III

1995 Rudolph FE-IIID

• used

• Manufacturer: Rudolph

Rudolph FE-IIID Dual Wavelength Focus Ellipsometer Measurement Console The Measurement Console contains the following components: • Measurement system (including vacuum control, stage, lifters, optical components...

Rudolph Metapulse II 200-X

• used

• Manufacturer: Rudolph
• Model: Metapulse 200

Rudolph MetaPULSE II 200 X Thickness Measurement System, s/n 200MP11-1608-AW-11. The MetaPULSE X Cu supports all aluminum interconnect processes and the silicides, ultra-thin barriers, and tungsten processes in a...

Rudolph RCB Reclean Block

• used

• Manufacturer: Rudolph

“Removed from a Rudolph F30 300mm Wafer Mounter & Defect Inspection System” Rudolph 300mm Reclean Block Wafer Spin Rinse Cup Assembly PC30AC-200-CACB Spare Inventory # A-19411 Removed from a Rudolph F30 300mm Waf...

Rudolph RCB Reclean Block

• used

• Manufacturer: Rudolph

“Removed from a Rudolph F30 300mm Wafer Mounter & Defect Inspection System” Rudolph 300mm Reclean Block Wafer Spray Cup Assembly PC3CAC-275-CACB TEL Working Inventory # A-19412 Removed from a Rudolph F30 300mm Wa...

Rudolph Autopol V

• used

• Manufacturer: Rudolph

Rudolph Research Autopol V Polarimeter Rudolph Autopol V six wavelength polarimeter 365, 405, 436, 546, 633nm TempTrol electronic heating and cooling from 15-30C A700T TempTrol NIST traceable quartz standard w...

1997 RUDOLPH FE-VII-SD

• used

• Manufacturer: Rudolph

The dual wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. Rudolph Technologiesl wavelength FE VII-SD is a production metrology tool built around a FOCUS ellipsometer. This ...

Rudolph COMPUTER DUAL PROCESSOR KONTRON

• used

• Manufacturer: Rudolph

As is, where is

RUDOLPH FE-VII-D, Focus Ellipsometer

• used

• Manufacturer: Rudolph

RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...

2007 RUDOLPH AXi 935 D Advanced Wafer Inspection, 12"

• used

• Manufacturer: Rudolph
• Model: AXI 935

2007 Vintage

2008 RUDOLPH NSX 105 Inspection System, 8"

• used

• Manufacturer: Rudolph
• Model: NSX-105

Parts machine 2008 Vintage

Rudolph ALM-11 CF30 300mm Wafer Inspection Camera Assembly Teli TEL Working

• used

• Manufacturer: Rudolph

“Removed from a Rudolph F30 300mm Wafer Mounter & Defect Inspection System” Rudolph ALM-11 CF30 300mm Wafer Inspection Camera Assembly Teli TEL Working Inventory # A-19421 Removed from a Rudolph F30 300mm Wafer M...

Rudolph FTM ellipsometer

• used

• Manufacturer: Rudolph

Rudolph FTM ellipsometer (Rudolph FTM ellipsometer) Rudolph FTM ellipsometer*Precise: 1nm resolution*Fast Operation: 4 seconds per measurement *Set film type, dial, insert sample, and...