- Trusted Seller
KLA AIT II system
- Manufacturer: KLA-Tencor
- Model: AIT II
Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...
United States - Trusted Seller
1995 KLA-Tencor Surfscan 6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Type: Wafer Surface Analysis System
United States - Trusted Seller
United States - Trusted Seller
United States - Trusted Seller
1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States - Trusted Seller
KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States - Trusted Seller
Signatone S-M90
- Manufacturer: Signatone
- Model: S-M90
Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual ProbeStation with SanjSCOPE™ EZ-THERM Lock-In Thermal Imaging System
United States - Trusted Seller
Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer
- Manufacturer: Angstrom
Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBench TFProbe Spectrometer UV-VIS High Power Fiber Light Source Vexta PK266PAA Stepping Motor, 2 Phase, 1.8/Step
United States - Trusted Seller
2008 RUDOLPH NSX 105 Inspection System, 8"
- Manufacturer: Rudolph
- Model: NSX-105
Parts machine 2008 Vintage
United States - Trusted Seller
United States - Trusted Seller
Nikon Optiphot 150 Inspection Microscope
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield and darkfield inspection stage has 6x6 xy travel 5 place nosepiece with optional motorized rotation CF BD Plan 5x/10x/20x/50x objectives Epi-illuminator ...
United States - Trusted Seller
2003 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...
United States - Trusted Seller
Signatone CM-465-22
- Manufacturer: Signatone
- Model: CM-465-22
Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...
United States - Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States - Trusted Seller
2022 TEL Precio XL
- Manufacturer: Tokyo Electron - TEL
- Model: Precio
Brand new TEL Precio XL. Delivery taken but never unpackaged/ un crated. Config in images
United States 
Tektronix 371B Test & Measurement (semiconductors)
- Manufacturer: Tektronix
- Model: 371B
Good condition Tektronix 371B Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA
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