Used Defect Inspection

Hitachi S 4500 Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

HITACHI SU8040 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: SU8040

Hitachi SU8040 Scanning Electron Microscope, is a high-quality SEM used in various industries, research, and educational settings for imaging and analyzing the surface of specimens at high resolution. Nanotechno...

HITACHI S-4700 Type II Scanning Electron Microscope: Parts only

• Manufacturer: Hitachi
• Model: S-4700

Experience the precision and power of the Hitachi S-4700 Type II Scanning Electron Microscope, a versatile tool essential for detailed material analysis. The upright microscope structure allows for comfortable op...

HITACHI S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-3400N

The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...

1994 Hitachi S 4500 SEM

• Manufacturer: Hitachi
• Model: S-4500

Hitachi S 4700 Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-4700

SEM

Hitachi S-4800-II

• Manufacturer: Hitachi
• Model: S-4800

Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Specification: Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2...

Hitachi S-4700-I w/EDX

• Manufacturer: Hitachi
• Model: S-4700

Status of Equipment: Crated Specification: Secondary electron image resolution: 2.1nm at 1kV 1.5nm at 15kV and WD = 12mm or X-ray analysis position Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X...

Hitachi S-4700-II

• Manufacturer: Hitachi
• Model: S-4700

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configuration Type II stage with 5 axis motorization Type I load lock, 4 inch (optional 6 inch) Full control pad CD Me...

2008 Hitachi SU-70

• Manufacturer: Hitachi
• Model: SU70

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Information: Status of Equipment: Refurbished Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV In-lens SE and BSE Signal...

1997 Hitachi S-4500 Type 11

• Manufacturer: Hitachi
• Model: S-4500

Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...

1998 Hitachi S 5200

• Manufacturer: Hitachi
• Model: S-5200

Hitachi S 5000 Field Emission Scanning Electron Microscope (SEM) Working condition. - Ultra high resolution 1998 Vintage

1995 Hitachi S 4500

• Manufacturer: Hitachi
• Model: S-4500

Type: Field Emission Scanning Electron Microscope (FE-SEM)

HITACHI SU-70

• Manufacturer: Hitachi
• Model: SU70

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Sc...