Semiconductors » Metrology / Inspection (semiconductors)

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Used diffusers

  • Trusted Seller
    KLA-Tencor Prometrix RS-75 Four Point

    KLA-Tencor Prometrix RS-75 Four Point Probe System

    • Manufacturer: KLA-Tencor
    • Model: Prometrix RS75

    KLA-TENCOR PROMETRIX RS75 FOUR POINT PROBE SYSTEM consisting of:- Model: RS-75- Four Point Probe System - Up to 200 mm wafers- One second per site overall measurement speed- A 49-site contour map with temperature...

    Decatur, GA
  • Trusted Seller
    KLA RS75/TCA

    KLA RS75/TCA

    • Manufacturer: KLA-Tencor

    • 6-8” wafer size (150MM) * Resistivity mapping system * With flat finder * H type loader * Refurbished, Complete tested and Calibration checked. KLA-Tencor RS-75 Resistivity Mapping System Specifications: ...

    United States
  • Trusted Seller
    KLA Flexus FLX2320

    KLA Flexus FLX2320

    • Manufacturer: KLA-Tencor
    • Model: FLX-2320

    KLA-TENCOR FLX-2320 FILM STRESS MEASUREMENT SYSTEM consisting of: - Model: FLX-2320I - Manual Wafer Load - Thin Film Stress Measurement System - Chuck Size can be configured for up to 8“ wafers - Temperature...

    United States
  • Trusted Seller
    1997 Hitachi S-4500 Type 11

    1997 Hitachi S-4500 Type 11

    • Manufacturer: Hitachi
    • Model: S-4500

    Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...

    United States
  • Trusted Seller
    1997 Hitachi S-4500 II Scanning

    1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

    • Manufacturer: Hitachi
    • Model: S-4500

    - Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

    United States
  • Trusted Seller
    1997 Hitachi S-4500 II Scanning

    1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

    • Manufacturer: Hitachi
    • Model: S-4500

    - Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

    United States
  • Semilab CMS3 non contact sheet

    Semilab CMS3 non contact sheet resistance measuring system

    • Manufacturer: Semilab

    CMS, CLS FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion. The CLS mo...

    $17,500 USD

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    Est. $344/mo

    San Jose, CA
  • Trusted Seller
    Hitachi S 3000 N Scanning

    Hitachi S 3000 N Scanning Electron Microscope (SEM)

    • Manufacturer: Hitachi
    • Model: S-3000N

    - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

    United States
  • Trusted Seller
    KLA Tencor Flexus 2908

    KLA Tencor Flexus 2908

    • Manufacturer: KLA-Tencor

    KLA Tencor Flexus 2908 Wafer size: 125mm-200mm Temperatures up to 900C Dual wavelength technology MS Windows based software Power: 230v, 50/60hz Tool primarily used for calculation of biaxial modulus of elasticit...

    Trim, Ireland
  • Trusted Seller
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    Munich Metrology Elymat II

    • Manufacturer: Unknown

    Munich Metrology Elymat II GeMeTec, Munich Metrology, Elymat II, 200mm, Electrolytical Metal Analysis Tool GeMeTec, Munich Metrology, Elymat II, 200mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (Ele...

    Bree, Ireland
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    GEMETEC Elymat III

    • Manufacturer: Unknown

    GEMETEC Elymat III GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines...

    Bree, Ireland
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    REVERA RVX5000

    • Manufacturer: Unknown

    REVERA RVX5000 REVERA RVX5000 [DIFFUSION MEASUREMENT XPS] 300 mm Vintage 2005

    Bree, Ireland
  • Trusted Seller
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    CAMECA LEXFAB300

    • Manufacturer: Cameca

    CAMECA LEXFAB300 CAMECA LEXFAB300 [DIFFUSION MEASUREMENT VDS] uncond. Eval. 300 mm Vintage 2007

    Bree, Ireland
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    Okura DP2301

    • Manufacturer: Okura

    Degital profiler Wafer size: 200mm

    Yongin-si, South Korea
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    Rudolph FE-Ⅳ

    • Manufacturer: Rudolph

    Thickness Measurement Wafer size: 200mm

    Yongin-si, South Korea
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Overview

Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

FAQ

What factors should I consider when buying semiconductor metrology equipment?

Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

How can I ensure safe shipping of semiconductor metrology equipment?

Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

What is the maintenance schedule for semiconductor metrology equipment?

Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.