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KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...

ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM
- Manufacturer: Orbotech
INFORMATION: ORBOTECH FPI-7092 AUTOMATIC OPTICAL INSPECTION SYSTEM MODEL: FPI-7092 M SERIAL NO: SF 021005 DATE OF MFG: 06-2002 VOLTAGE: 120 VAC AMP: 32A FREQUENCY: 50/60 HZ The Orbotech FPI-7092 System is an AOI ...
Santa Barbara, CA
KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CAAgilent 41501-60043 Power Supply for Agilent 41501B REFURBISHED 90 Day Warranty
- Manufacturer: Agilent - Keysight
- Model: 41501B
“Power supply was rebuild and should last for a very long time. 90 day exchange warranty.” THIS REFURBISHED POWER SUPPLY IS GOING TO LAST FOR A LONG TIME. 90 DAY EXCHANGE WARRANTY (warranty seal in the picture mu...
$1,950 USDMenlo Park, CA
Rudolph FE-VII-SD
- Manufacturer: Rudolph
For sale is a high-precision Rudolph FE-VII-SD Ellipsometer, known for its advanced capabilities in thin film measurement and analysis. This tool is ideal for semiconductor manufacturing, materials research, and ...
$4,950 USDHayward, CA
