Semiconductors » Test & Measurement (semiconductors)

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Used Test & Measurement (Semiconductors)

  • Trusted Seller
    KLA AIT II system

    KLA AIT II system

    • Manufacturer: KLA-Tencor
    • Model: AIT II

    Wafer size: 6" It is complete and has no known issues OEM Model Description The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool perf...

    United States
  • Trusted Seller
    1995 KLA-Tencor Surfscan 6200

    1995 KLA-Tencor Surfscan 6200

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    Type: Wafer Surface Analysis System

    United States
  • Trusted Seller
    2000 KLA 6220 Surfscan

    2000 KLA 6220 Surfscan

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6220

    Great working order

    United States
  • Trusted Seller
    2014 HMI eScan 500

    2014 HMI eScan 500

    • Manufacturer: HMI
    • Model: Escan

    HMI eScan 500, Defect Review, 300mm Tool ID: SEI2703

    United States
  • Trusted Seller
    1997 KLA AIT I Main

    1997 KLA AIT I Main System

    • Manufacturer: KLA-Tencor
    • Model: AIT I

    Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...

    United States
  • Trusted Seller
    KLA-TENCOR Surfscan 5500

    KLA-TENCOR Surfscan 5500

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 5500

    - Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...

    United States
  • Trusted Seller
    Signatone S-M90

    Signatone S-M90

    • Manufacturer: Signatone
    • Model: S-M90

    Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual ProbeStation with SanjSCOPE™ EZ-THERM Lock-In Thermal Imaging System

    United States
  • Trusted Seller
    Angstrom SE200BM Spectroscopic Ellipsometer w/

    Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer

    • Manufacturer: Angstrom

    Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBench TFProbe Spectrometer UV-VIS High Power Fiber Light Source Vexta PK266PAA Stepping Motor, 2 Phase, 1.8/Step

    United States
  • Trusted Seller
    2008 RUDOLPH NSX 105 Inspection

    2008 RUDOLPH NSX 105 Inspection System, 8"

    • Manufacturer: Rudolph
    • Model: NSX-105

    Parts machine 2008 Vintage

    United States
  • Trusted Seller
    Rudolph / August NSX 95

    Rudolph / August NSX 95

    • Manufacturer: Rudolph
    • Model: NSX-95

    Automated Defect Inspection

    United States
  • Trusted Seller
    Nikon Optiphot 150 Inspection Microscope

    Nikon Optiphot 150 Inspection Microscope

    • Manufacturer: Nikon
    • Model: Optiphot 150

    Reflected light microscope configured for brightfield and darkfield inspection stage has 6x6 xy travel 5 place nosepiece with optional motorized rotation CF BD Plan 5x/10x/20x/50x objectives Epi-illuminator ...

    United States
  • Trusted Seller
    HP E2677A SOLDER-IN DIFFERENTIAL PROBE

    HP E2677A SOLDER-IN DIFFERENTIAL PROBE HEAD TESTED M5228

    • Manufacturer: HP

    Tested OK Weight: 1 LBS | Shipping: Calculated at Checkout | Model part number: E2677A

    $500 USD
    El Paso, TX
  • Tektronix 575

    Tektronix 575

    • Manufacturer: Tektronix
    • Model: 575

    This Curve Tracer displays the dynamic characteristic curves of both NPN and PNP transistors on the screen of a 5 inch cathode-ray tube. Several different transistor characteristic curves may be displayed, includ...

    Webster, MA
  • Trusted Seller
    HP E2677A SOLDER-IN DIFFERENTIAL PROBE

    HP E2677A SOLDER-IN DIFFERENTIAL PROBE HEAD TESTED M5225

    • Manufacturer: HP

    Tested OK Weight: 1 LBS | Shipping: Calculated at Checkout | Model part number: E2677A

    $500 USD
    El Paso, TX
  • Trusted Seller
    AGILENT E2677A SOLDER-IN DIFFERENTIAL PROBE

    AGILENT E2677A SOLDER-IN DIFFERENTIAL PROBE HEAD TESTED M5261

    • Manufacturer: Agilent - Keysight

    Extra Information Brand: AGILENT MPN: E2677A Shipping Weight: 1 LBS Shipping Dimensions: 6 (in) × 6 (in) × 6 (in)

    $350 USD
    El Paso, TX
4647484950

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.