Building Filters
- Trusted Seller
Spea 3030IL Dual bay
- Manufacturer: SPEA
For more information regarding stock and pricing, please click here. Spea 3030IL dual bay in excellent condition. Vintage 2006 The 3030IL is the fully automatic bed-of-nails tester expressly designed to minimize ...
Veenendaal, Netherlands Module-Level Burn-in
Input/ output options: JEDEC Tray | Selection of packages: Silicon Carbide (SiC), Gallium Nitride (GaN) Power devices | Channel number: Up to 720 power device burn-in test parallelism | Burn-in duration: Program...
Penang, Malaysia
Agilent/Keysight 4155C
- Manufacturer: Agilent - Keysight
- Model: 4155C
The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and add...
Agilent/Keysight 4156C
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
- Trusted Seller
National Instruments 777959-01
- Manufacturer: National Instruments
777959-01 | PCI-1422, 16-Bit, Parallel Digital, Image Acquisition Board
Cary, NC 
Wafer-Level Burn-in
Chuck quantity: Octa Chuck | Package type: Silicon Carbide (SiC) Power Device | Wafer size: 6, 8 inch | Input/ output option: Wafer Cassette (Up to 2 cassettes) | Die per wafer burn-in parallelism: 4000 | Total ...
Penang, Malaysia- Trusted Seller
KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller
2019 Viscom X7056RL AOI/AXI
- Manufacturer: Viscom
Model: X7056RL 3D X-ray Inspection Simultaneous Optical and X-ray Inspection Selectable Resolution The Viscom X7056 combines high-performance AOI with parallel AXI, in a family of inspection systems. The RL versi...
Magnolia, TX 
Tektronix 4210-SMU/PA-R^
- Manufacturer: Tektronix
- Model: 4210-SMU
The Keithley High Power Source-Measure Unit for 4200-SCS. 1A to 100fA, 200V to 1µV, 20 Watt. Voltage error when using the ground unit is included in the Keithley 4210-SMU. The Keithley is four-quadrant source/sin...
Discrete-Level Test
Input options: Vibrator Bowl, Plastic Tube Stacker | Output options: Tape & Reel, Plastic Tube Stacker | Test capabilities: Electrical Functional Test, Open Short Test, Insulation test | Test site: Dual Test Sit...
Penang, Malaysia
Cyberoptics Automatic Optical Inspection 3D AOI SQ3000
- Manufacturer: Cyberoptics
- Model: SQ3000
Product details Payment &Shipping terms 3D automatic optical inspection system The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D mu...
Shenzhen, China
Cyberoptics 3D AOI SQ3000
- Manufacturer: AOI
SQ3000™ FASTEST 3D AOI IN THE INDUSTRY DESCRIPTION: The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D multi-view sensors that enabl...
Shenzhen, China- Trusted Seller
ACCRETECH TSK UF3000
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
ACCRETECH / TSK UF3000 Production Wafer Prober EQUIPMENT DETAILS: tool was ‘initialized’ successfully recently. -Functional are ok for small array probe card -For large array probe card may have issue with sh add...
Bree, Ireland - Trusted Seller
Accretech TSK UF200SA
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200SA
Accretech TSK UF200SA Wafer Prober x 7 Sets Available June 2015 Main Control System Hard Disk Drive 3-1/2″ Floppy Disk Drive Magneto Optical Disk Drive Head Stage Single Cassette Loaders for 25 Wafers (6- to 8-in...
Bree, Ireland Agilent/Keysight U9405B
- Manufacturer: Agilent - Keysight
The enhanced Keysight Flexicore i1000 ICT system with parallel test capability addresses key increasing trends in manufacturing while retaining all previous features. With the increased depth and built-in instrum...
Farmingdale, NJ
