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RUDOLPH FE-VII-D, Focus Ellipsometer
used
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM W/ 4200 SMU
used
- Manufacturer: Keithley
- Model: 4200
Information: 1) KEITHLEY 4200 SEMICONDUCTOR CHARACTERIZATION SYSTEM 3) 4200 SMU CARDS The Keithley 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time...
Santa Barbara, CA