Semiconductors » Test & Measurement (semiconductors)

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  • Trusted Seller
    KLA Tencor Surfscan 6200 Particle

    KLA Tencor Surfscan 6200 Particle Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...

    Decatur, GA
  • Trusted Seller
    KLA-Tencor Surfscan SP1 DLS Unpatterned

    KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan SP1

    KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...

    Decatur, GA
  • Trusted Seller
    1996 KLA TENCOR Surfscan 6420

    1996 KLA TENCOR Surfscan 6420

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6420

    Automatic Surface Inspection System ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Thro...

    Europe
  • Trusted Seller
    1996 KLA Tencor Surfscan 6420

    1996 KLA Tencor Surfscan 6420

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6420

    ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ...

    Europe
  • Trusted Seller
    1996 KLA Tencor Surfscan 6420

    1996 KLA Tencor Surfscan 6420

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6420

    ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ...

    Europe
  • 2000 KLA TENCOR AIT AIT

    2000 KLA TENCOR AIT AIT XP+(Fusion)

    • Manufacturer: KLA-Tencor
    • Model: AIT XP

    [ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...

    Cheonan-si, South Korea

Overview

Semiconductor inspection and test equipment are specialized machines used to ensure the quality and functionality of semiconductor devices. These machines perform various tests and inspections, including visual inspection, electrical testing, and defect analysis, to identify and address any issues in the semiconductor manufacturing process. They are crucial in maintaining the high standards required in the semiconductor industry.

FAQ

What factors should I consider when buying semiconductor inspection and test equipment?

Consider the equipment's compatibility with your existing systems, the types of tests it performs, its accuracy, and the manufacturer's support and service options. Also, evaluate its overall condition and any included software or accessories.

How can I ensure safe shipping of semiconductor inspection and test equipment?

Use a specialized transport service experienced in handling delicate and high-value equipment. Ensure the equipment is properly packaged, secured, and insured during transit.

What maintenance is required for semiconductor inspection and test equipment?

Regular maintenance includes cleaning, calibration, and software updates. Follow the manufacturer’s guidelines for specific maintenance intervals and procedures to ensure optimal performance and longevity of the equipment.