Building Filters
Nikon OPTIPHOT
- Manufacturer: Nikon
- Model: Optiphot
Nikon Optiphot Reflected Light Brightfield Darkfield Microscope with light source, 5" x 6" solid top stage, two Mitutoyo digital micrometer positioners - .00005 0.001mm and 4 objectives: BD Plan 10 0.25, BD Plan ...
Farmingdale, NJ- Trusted Seller
KLA-Tencor Surfscan 6400 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6400
KLA-TENCOR SURFSCAN 6400 Particle NSPECTION SYSTEMconsisting of:- Model: Surfscan 6400- Particle Inspection System- System can handle up to 200mm capable- Cassette Handling: Single puck handling from single casse...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan 6220 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-TENCOR SURFSCAN 6220 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6220- Particle Inspection System- Bare Wafer Surface Defect Inspection System- Substrate/Sizes: 2", 3", 4", 6" and 8" Wafer Cap...
Decatur, GA - Trusted Seller
Rudolph NSX-115 Advanced Wafer Inspection
- Manufacturer: Rudolph
- Model: NSX-115
Rudolph NSX-115 Advanced Wafer Inspection consisting of: - Model: NSX-115- Ultra port quick change top plate & film frame quick change top plate- Ultra port 50/50: - Loadport A is for film frame for 6&8” filmfr...
Decatur, GA 
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...
Keysight Technologies B1500A
- Manufacturer: Agilent - Keysight
- Model: B1500A
Details The Keysight (Agilent) B1500A Semiconductor Parameter Analyzer is a comprehensive device characterization solution that supports IV, CV, pulse/dynamic IV, and more. It includes a modular mainframe that ac...
Dublin, Ireland
COMET VXP 160.15, vintage 2006, X ray device
- Manufacturer: Comet
Machine sold as is. COMET VXP-160.15 is an advanced x-ray imaging equipment designed for medical and industrial applications. It utilizes high energy x-rays to create images of internal objects such as bones, or...
Estonia- Trusted Seller
KLA-Tencor Surfscan SP1 DLS
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-Tencor Surfscan SP1 DLS The Surfscan SP1 DLS unpatterned wafer inspection system captures yield-limiting defects down to 50nm at high throughput, to accelerate yield learning rates across all process modules ...
Bree, Ireland B1500A - Semiconductor device parameter analyzer - KEYSIGHT TECHNOLOGIES (AGILENT / HP) - 1 KHz - 5 MHz
- Manufacturer: Agilent - Keysight
- Model: B1500A
Semiconductor Device Parameter Analyzer1 KHz - 5 MHz Switch between CV and IV measurements without re-cabling Capture ultra-fast transient phenomena not possible with other conventional test instruments Detect mu...
Lannion, France
Cyberoptics Automatic Optical Inspection 3D AOI SQ3000
- Manufacturer: Cyberoptics
- Model: SQ3000
Product details Payment &Shipping terms 3D automatic optical inspection system The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D mu...
Shenzhen, ChinaJUKI AOI Inspection machine RV-2-3DHL
- Manufacturer: Juki
Juki AOI Inspection machine RV-2-3DHL is an advanced 3D Aoi inspection machine designed to ensure high-quality printed circuit boards (PCBs) inspection. Equipped with cutting-edge 3D inspection technology, the RV...
Guangdong, China
Cyberoptics 3D AOI SQ3000
- Manufacturer: AOI
SQ3000™ FASTEST 3D AOI IN THE INDUSTRY DESCRIPTION: The Ultimate in Speed and Accuracy. SQ3000 3D Automated Optical Inspection (AOI) system maximizes ROI and line utilization with 3D multi-view sensors that enabl...
Shenzhen, China
SAKI BF-10Z 2D AOI 2016
- Manufacturer: Saki
Product Details: Place of Origin: China Brand Name: Saki Model Name: BF-10Z Specifications: Standard Single lane Vintage: 2016 Payment & Shipping Terms: Minimum Order Quantity: 1 unit Price: USD Packaging Details...
Shenzhen, China- Trusted Seller
2011 Orbotech Ultra Discovery VM
- Manufacturer: Orbotech
- Model: Discovery
Manufacturer: Orbotech Model: Ultra Discovery VM Year of Manufacture: 2011 Ultra Discovery VM delivers simple, intelligent, and powerful AOI performance with 10 µm line/space inspection capabilities for FC-BG...
Munich, Germany 
STI iFocus Wafer Inspection Machine
- Manufacturer: STI
iFocus STI’s iFocus is a highly intelligent precision wafer inspection system that offers a comprehensive solution for the inspection of frame and/or whole wafer. Using STI’s proprietary On-The-Fly (OTF™) vision,...
Singapore
