Used ram

Mitsui B-PDSWS2M-Site TSC3 Computer Advantest WUN-H3610253SITECH T2000 Working

• Manufacturer: Advantest
• Model: T2000

“Removed from a Advantest T2000 SoC Test System. The unit boots to the OS but requires a password at the login screen to proceed.” Mitsui B-PDSWS2M-Site TSC3 Computer Advantest WUN-H3610253SITECH T2000 Working Re...

Semilab SE-2100 Spectroscopic Ellipsometer Computer PC Core2 Duo 2.93GHz Working

• Manufacturer: Semilab

“The unit fully boots to the desktop the front right pull handle is slightly bent (see photos).” Semilab SE-2100 Spectroscopic Ellipsometer Computer PC Core2 Duo 2.93GHz Working Installed PCB's Part No: DeLock 3W...

Quins Pro PCB

Technical details Quins Pro PCB ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

Quins Pro PCB

Technical details Quins Pro PCB ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

QUINS Ultimate

Technical details Quins Ultimate ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

Quins Pro

Technical details Quins Pro ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

Quins Pro

Technical details Quins Pro ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

Quins Pro UV

Technical details Quins Pro UV ‍Custom-made products possible on request: long, big, high, inline For further information or a demo, please do not hesitate to contact us.

Takano WM-10R Surface Particle Inspection System

• Manufacturer: Takano
• Model: WM-10

TAKANO WM-10R SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-10R- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 12" Wafer Capable (Chuck and Carrier type dependent)- Substrate T...

FEI Company Nova 600 NanoLab

• Manufacturer: FEI

FEI Company Nova 600 NanoLab Focused Ion Beam System EQUIPMENT DETAILS: Configuration. Audit to verify. DescriptionRemarks Base FIB SystemNova Dual Beam Vintage Serial NumberD0140 Single or Dual Beam Ion ColumnDu...

FEI Company Strata DB 235

• Manufacturer: FEI
• Model: STRATA DB 235

FEI Company Strata DB 235 DualBeam FIB/SEM EQUIPMENT DETAILS: DescriptionRemarks Base FIB SystemFEI Dual Beam 235 Vintage Serial Number10101 Single or Dual Beam Ion ColumnDual Beam system Beam Energy30Kv Laser In...

Electroglas 4085X Prober

• Manufacturer: Electroglas
• Model: 4085X

High volume cassette to cassette wafer prober. 200mm Temptronic thermal inducing non-contacting Wafer Chuck Temptronic TP03010B-2100-1 Temperature Controller, with IEEE Interface * Wide Temperature range: 0° to +...

iFlex Tester sn 1209F291

• Manufacturer: Teradyne
• Model: IFLEX

Teradyne iFlex tester --24 slot testhead --xW8400 (can be upgraded to Z800, or Tera1) --Integrated RAM manipulator Config: build-to-order Please contact us for your required configuration Available as bare ...

iFlex Tester sn 0944F274

• Manufacturer: Teradyne
• Model: IFLEX

Teradyne iFlex tester sn 0944F274 --24 slot testhead --xW8400 (can be upgraded to Z800, or Tera1) --Integrated RAM manipulator Config: build-to-order Please contact us for your required configuration Availa...

D10 Tester sn 293610029

• Manufacturer: Credence

Credence D10 Tester sn 293610029 Computer: Intel Xeon 2.4GHz CPU, 2GB RAM, 320GB HDD Manipulator: included Config --2x DPIN96 16M, pn 671-5450-55 --1x DPS16, pn 672-6136-07 --1x DIBU, pn 671-7045-10 --6x ...