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LEO 1455 Scanning Electron Microscope (SEM)
- Manufacturer: LEO Electron Microscopy
LEO 1455 Scanning Electron Microscope Capable of handling a full 6in (150mm) wafer Tool unfortunately did not work well after receiving a software and PC upgrade. However, tool may work with some deeper investi...
New York, USA
Tektronix 4200-ZY^
- Manufacturer: Tektronix
- Model: 4200
The Zyvex S100, part of the NanoWorks® Tools product line, is a manipulation and testing tool used with a scanning electron microscope (SEM) or a focused ion beam (FIB) system for micro and nanoscale research and...
- Trusted Seller
Bree, Ireland - Trusted Seller
Bree, Ireland - Trusted Seller
Bree, Ireland - Trusted Seller
Bree, Ireland - Trusted Seller

Philips XL30S FEG SEM system
- Manufacturer: Philips
Philips XL30S (FEG) SEM System contains : SEM, EDAX model APOLLO X serial number 2407 microscope XL30, NXDS oil free pump unit, Jun-Air compressor model 6-X.
Bree, Ireland - Trusted Seller
Bree, Ireland - Trusted Seller

Amray Inc 3800c SEM Defect Review DR
- Manufacturer: Amray
Amray, Inc. 3800c SEM – Defect Review (DR) 200mm
Bree, Ireland - Trusted Seller

200mm Inspection SEM SEIKO Sxi200P K-A113000022
- Manufacturer: Unknown
200mm Inspection SEM – SEIKO ‘Sxi200P K-A113000022’
Bree, Ireland - Trusted Seller

200mm Inspection SEM SEIKO Sxi200P K-A113000022
- Manufacturer: Unknown
200mm Inspection SEM – SEIKO ‘Sxi200P K-A113000022’
Bree, Ireland - Trusted Seller

SELA EM2 Automated TEM and SEM sample preparation system
- Manufacturer: SELA
SELA EM2 Automated TEM and SEM sample preparation system
Trim, Ireland - Trusted Seller

FEI Company Strata DB 235
- Manufacturer: FEI
- Model: STRATA DB 235
FEI Company Strata DB 235 DualBeam FIB/SEM EQUIPMENT DETAILS: DescriptionRemarks Base FIB SystemFEI Dual Beam 235 Vintage Serial Number10101 Single or Dual Beam Ion ColumnDual Beam system Beam Energy30Kv Laser In...
Bree, Ireland - Trusted Seller

FEI Company Strata 400
- Manufacturer: FEI
- Model: STRATA 400
FEI Company Strata 400 Dual Beam Focused Ion Beam System EQUIPMENT DETAILS: Configuration. Audit to verify. DescriptionRemarks Base FIB SystemFEI Strata 400 Vintage Serial NumberD1003 Single or Dual Beam Ion Colu...
Bree, Ireland
Yongin-si, South Korea
