Building Filters
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ISVI, AOI IC-C25CXP, 15M 15UM F8 DMV CAMERA 25 MP WITH LENS M5132
- Manufacturer: ISVI, AOI
Very good condition Extra Information Brand: ISVI, AOI MPN: IC-C25CXP, 15M 15um F8 Shipping Weight: 13 LBS Shipping Dimensions: 18 (in) × 12 (in) × ...
$1,500 USDEl Paso, TX - Trusted Seller

Nikon Measurescope UM2 with Nikon AFX-IIA
- Manufacturer: Nikon
Nikon Measurescope UM2 with Nikon AFX-IIA Nikon Measurescope UM-2 operates with transmission and reflection modes as well as bright field and dark field modules. System consists of UM-2 frame, Nikon O2L Table ...
Trim, Ireland - Trusted Seller

KLA-Tencor Surfscan 6400 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6400
KLA-TENCOR SURFSCAN 6400 Particle NSPECTION SYSTEMconsisting of:- Model: Surfscan 6400- Particle Inspection System- System can handle up to 200mm capable- Cassette Handling: Single puck handling from single casse...
Decatur, GA - Trusted Seller

KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA - Trusted Seller

NEW Takano WM-7SR Surface Particle Inspection System
- Manufacturer: Takano
- Model: WM-7
TAKANO WM-7SR SURFACE PARTICLE INSPECTION SYSTEM consisting of:- Model: WM-7SR- Bare wafer surface defect inspection system- Substrate/Sizes: 2" - 8" Wafer Capable (Chuck and Carrier type dependent)- Substrate Th...
Decatur, GA - Trusted Seller

KLA Tencor Surfscan 6200 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...
Decatur, GA - Trusted Seller

KLA-Tencor Surfscan 6220 Particle Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-TENCOR SURFSCAN 6220 PARTICLE INSPECTION SYSTEM consisting of: - Model: Surfscan 6220- Particle Inspection System- Bare Wafer Surface Defect Inspection System- Substrate/Sizes: 2", 3", 4", 6" and 8" Wafer Cap...
Decatur, GA - Trusted Seller
KLA-Tencor Surfscan SP1 DLS Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
KLA-TENCOR SURFSCAN SP1 DLS UNPATTERNED SURFACE INSPECTIONSYSTEM consisting of:- Model: SP1 DLS with 300mm Single FOUP/FIMS Handler (other handlers available)- Currently Configured for 200/300mm Wafers - Unpatter...
Decatur, GA - Trusted Seller

Cyberoptics QX600 AOI - 2015 #25072
- Manufacturer: Cyberoptics
Cyberoptics Cyberoptics QX600 AOI - 2015 #25072 DOM: February 2015 PN: 8019415 SN: 25072 457 x 308 mm (18” x 12”) inspection area 12 um high-resolution, high-speed CMOS cameras Inspection Speed 200cm2/s Top side...
- Trusted Seller

Nanometrics Nanospec AFT2100 Film Thickness Measurement System
- Manufacturer: Nanometrics
- Model: Nanospec AFT 2100
film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator spot size 6.5um to 65um wavelength range 400-800nm 16 standar...
United States - Trusted Seller

2004 KLA- Tencor Surfscan SP 1 DLS Unpatterened Surface Inspection
- Manufacturer: KLA-Tencor
- Model: Surfscan SP1
- Refurbished - 0.050 um Defect Sensitivity on Polished Bare Silicon - Enhanced Rough Film Sensitivity - Already upgraded with ENH SS laser - Defect Map and Histogram with Zoom - RTDC (Real Time Defect Class...
United States - Trusted Seller

KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States 
Nikon 200mm wafer inspection station with NWL200-TMB (2012) wafer loader and Eclipse L200 microscope
- Manufacturer: Nikon
- Model: NWL200
Nikon 200mm automated inspection system with Eclipse L200 microscope and Nikon NWL200-TMB wafer loader Topside, Macro, backside inspection modes May be configured for 150mm or 200mm wafers. Â Includes shuttle s...

Nanometrics Nanospec AFT2100 Film Thickness Measurement System
- Manufacturer: Nanometrics
- Model: Nanospec AFT 2100
UPGRADE AVAILABLE TO FLAT PANEL MONITOR ADD $3500. film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x/50x objectives including new vertical illuminator spot size 6...
- Trusted Seller
Bree, Ireland
