Building Filters

LGR-Series
- Manufacturer: TOWA JAPAN
Enables high-precision blade cutting of lead-less device products such as QFN packages. Selectable blade cut(FMS3040-HC) or laser cut(LGR1040) depending on process and lead frame design. Combining dedicated lead ...
Kyoto, Japan
HORIBA STEC, Co., Ltd. LG-100 Series
- Manufacturer: Horiba
Laser Gas Analyzer Supporting advanced manufacturing processes for semiconductors through HORIBA’s unique built-in IRLAM infrared gas analysis technology Laser Gas Analyzer LG-100 Series can take real-time measur...
Kyoto, Japan
MiPLATO-SiC
SiC Wafer Defect Inspection System The SiC Wafer Defect Inspection System MiPLATO-SiC is a PL mapping system optimized for SiC wafers. It acquires the spectrum of the entire wafer in a short time using spiral map...
Kyoto, Japan
HORIBA Advanced Techno Co., Ltd. HE-480R
- Manufacturer: Horiba
Resistivity Meter for Semiconductor Cleaning Processes A specific resistance meter ideal for monitoring the purity of ultra-pure water used in cleaning processes. It accurately measures ultra-pure water during pr...
Kyoto, Japan
HORIBA Advanced Techno Co., Ltd. HD-960L
- Manufacturer: Horiba
HF (Hydrofluoric Acid) DO (Dissolved Oxygen) Monitor / Pure Water DO (Dissolved Oxygen) Monitor This is a dissolved oxygen monitor designed for low-flow applications, ideal for monitoring the concentration of di...
Kyoto, Japan
HORIBA Advanced Techno Co., Ltd. UP-100
- Manufacturer: Horiba
Micro Volume pH Monitor A pH monitor that embodies state-of-the-art precision technology. Enabling measurements with an extremely small sample volume of 500μL (1 millionth of a liter) per measurement, making it s...
Kyoto, Japan
HORIBA, Ltd. PD10-EX
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Complete particle detection and removal with one machine for enhanced efficiency and yield improvement in semiconductor manufacturing processes Since its launch in 1984, t...
Kyoto, Japan
HORIBA, Ltd. Xtrology
- Manufacturer: Horiba
Fully Automated Thin Film Inspection System Combines multiple sensors and automation technology to provide increased value for semiconductor wafer inspection The new product, "Xtrology," Fully Automated Thin Film...
Kyoto, Japan
PyroSense Series
more In-Situ Monitoring System The PyroSense Series is an in-situ monitoring system for epitaxial growth processes in MOCVD/MBE. It enables inline monitoring of temperature, film thickness (growth rate), and warp...
Kyoto, Japan
HORIBA, Ltd. PD10
- Manufacturer: Horiba
Reticle / Mask Particle Detection System Next-generation inspection platform to meet future needs PD10 is the latest generation of the HORIBA Particle Inspection product line. Based on an innovative modular platf...
Kyoto, Japan
HORIBA STEC, Co., Ltd. SEC-8000 F/D/E Series
- Manufacturer: Horiba
High Temperature Digital Mass Flow Controller The SEC-8000F/D/E series can operate in high temperature environments, from 15 ℃ to 120 ℃, for a variety of tasks including semiconductor and compound semiconductor p...
Kyoto, Japan
HORIBA, Ltd. RP-1
- Manufacturer: Horiba
Reticle/Mask Particle Remover The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacem...
Kyoto, Japan
