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JEOL AP002128(01) Processor Board PCB Card FIS(3)PB JSM-6400F Used Working
- Manufacturer: Jeol
“Removed from a JEOL JSM-6400F SEM Scanning Electron Microscope System” JEOL AP002128(01) Processor Board PCB Card FIS(3)PB JSM-6400F Used Working Inventory # 17956 This JEOL AP002128(01) Processor Board PCB Card...
$1,502 USDAlbuquerque, NM - Trusted Seller
JEOL AP002106(01) Processor Board PCB Card INTER FACE(1)PB JSM-6400F Used
- Manufacturer: Jeol
“Removed from a JEOL JSM-6400F SEM Scanning Electron Microscope System” JEOL AP002106(01) Processor Board PCB Card INTER FACE(1)PB JSM-6400F Used Inventory # 17962 This JEOL AP002106(01) Processor Board PCB Card ...
$1,002 USDAlbuquerque, NM - Trusted Seller
JEOL AP002103(00) Processor Board PCB Card LENS I/O(2)PB KI JSM-6400F Used
- Manufacturer: Jeol
“Removed from a JEOL JSM-6400F SEM Scanning Electron Microscope System” JEOL AP002103(00) Processor Board PCB Card LENS I/O(2)PB KI JSM-6400F Used Inventory # 17972 This JEOL AP002103(00) Processor Board PCB Card...
$1,002 USDAlbuquerque, NM - Trusted Seller
JEOL AP001116-01 Processor Board PCB Card VIDEO CONT(2)PB TN JSM-6400F Used
- Manufacturer: Jeol
JEOL AP001116-01 Processor Board PCB Card VIDEO CONT(2)PB TN JSM-6400F Used Inventory # 17974 This JEOL AP001116-01 Processor Board PCB Card VIDEO CONT(2)PB TN JSM-6400F is used working surplus. The physical cond...
$1,002 USDAlbuquerque, NM 
Fischione Instruments 1020 plasma cleaner for TEM and SEM samples
- Simultaneously cleans transmission and scanning electron microscope specimens and specimen holders - Enhances imaging and analytical results - Removes existing carbonaceous contamination - Prevents contaminatio...
- Trusted Seller
Hitachi REM S806
- Manufacturer: REM
- Model: S-806
Hitachi Scanning Electron Microscope S806. With large specimen chamber. With Thermo/Noran EDX system Six. Detector nitrogen-cooled. Company: Hitachi Model: REM S806 Comment: German documents. Hitachi REM S806 Sco...
Burladingen, Germany - Trusted SellerMake Offer
Hitachi S-4500
- Manufacturer: Hitachi
- Model: S-4500
Hitachi S-4500 , Scanning electron microscope Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50 - 500,000 times, cathode (cold field emission), acceleration voltage 0.5 - 30 kV, manual sample adjustmen...
Bialogard, PolandVisit Auction Website - Trusted Seller
Hitachi S-6200 Field Emission CD Scanning Electron Microscope configured for 150mm 150-200mm capable with modification with dual Seiko Seiki STP-300H turbomolecular pumps dual STP control units
- Manufacturer: Hitachi Seiki
Hitachi S-6200 Field Emission CD Scanning Electron Microscope, configured for 150mm (150-200mm capable with modification), with dual Seiko Seiki STP-300H turbomolecular pumps, dual STP control units
Bree, Ireland - Trusted Seller
JEOL JSM 6100
- Manufacturer: Jeol
- Model: JSM
JEOL JSM 6100 JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE Scanning Electron Microscope with LaB Filament
Bree, Ireland - Trusted Seller
Hitachi S-2400
- Manufacturer: Hitachi
- Model: S-2400
Hitachi S-2400 HITACHI S-2400 SCANNING ELECTRON MICROSCOPE Scanning Electron Micrscope (SEM)
Bree, Ireland - Trusted Seller
JEOL BP101858-00 Amplifier PCB Card MAG BFR AMP PB JWS-2000 SEM Working Spare
- Manufacturer: Jeol
“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System” JEOL BP101858-00 Amplifier PCB Card MAG BFR AMP PB JWS-2000 SEM Working Spare Inventory # CONF-1261 Model No: MAG BFR AMP...
$609 USDAlbuquerque, NM - Trusted Seller
2019 ThermoFisher OptiFIB Taipan G2+ DualBeam FIB-SEM System
- Manufacturer: Thermo Fisher Scientific
Manufacturer: ThermoFisher Model: OptiFIB Taipan G2+ Year of Manufacture: 2019 Type of Machine : DualBeam Focused Ion Beam – Scanning Electron Microscope (FIB-SEM) Condition: Used . Excellent working and phys...
Portland, OR 
2014 Hitachi High-Tech Hitachi High-Tech SU1510
- Manufacturer: Hitachi
Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Halcyonics Mod 2M Active Vibration Isolation supports with controller
The Halcyonics MOD-2 M (often referred to as the MOD-2 M) is a legacy active vibration isolation control unit, commonly used with older scanning electron microscopes (SEMs), such as those by Carl Zeiss, and other...
$3,450 USDSan Jose, CA
