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- Trusted Seller
Jeol JSM 35 C
- Manufacturer: Jeol
- Model: JSM
Jeol SEM model JSM 35 C. With EDX Ortec. 2 sample stages (80 x 80 mm). With EDX Ortec. Status permanently under maintenance contract. Company: Jeol Model: JSM-35C Comment: German documents for Id. 18191 The follo...
Burladingen, Germany - Trusted Seller
Jeol JSM 840 A
- Manufacturer: Jeol
- Model: JSM
Jeol electron microscope model JSM 840 A. With 2 backscatter detectors. Programmable stages Tracor Northern 5600 revB. Image analysis system AnalySIS 2.1. Noran X-Ray analysis system. New price: 143,394 Euro.\nCo...
Burladingen, Germany - Trusted Seller
Asia - Trusted Seller
1994 Hitachi S 4500 Scanning Electron Microscope with EDX
- Manufacturer: Hitachi
- Model: S-4500
- With EDX - System Config available upon request - Equipment is in working condition - Vintage 1994
Asia Varian CPI Triscroll
- Manufacturer: Varian
- Model: TRISCROLL
The Agilent Varian 300 Triscroll dry scroll vacuum pump is designed for high reliability with a 8.8 CFM pumping speed and an ultimate pressure of 1x10-2 Torr. The Triscroll pumps produces oil-free vacuum with the...
$1,575 USDFarmingdale, NJ- Trusted Seller
JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare
- Manufacturer: Jeol
“Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System” JEOL Electron Detector Assembly JWS-7555S Wafer Defect Review SEM Working Spare Inventory # CONF-1330 Removed from a JEO...
$1,511 USDAlbuquerque, NM - Trusted Seller
2004 JEOL SEM JSM-6360LV
- Manufacturer: Jeol
- Model: JSM
JEOL SEM JSM-6360LV Vintage : 2004yr Includes : •JSM-6360LV •EDAX G-XM2 CDU/SUTW •61090(MS) 2-Axis Motor Stage(Max Specimen Size 150 mm, 80x40mm) •47414 PC Unit(2 USB Port, PC Card Slot) •47512 CRT Monitor...
Gunpo-si, South Korea - Trusted Seller
Fischione 1020 PLASMA CLEANER SEM/ TEM/ STEM ELECTRON MICROSCOPE - TESTED
- Manufacturer: Fischione
Make: Fischione Instruments Model: 1020 Type: Plasma Cleaner for Scanning Electron Microscope SEM/ Transmission Electron Microscope TEM/ STEM Description This plasma cleaner has been tested to be in good work...
Asia 
Hitachi High-Tech Hitachi High-Tech S-3700N
- Model: S-3700N
Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Hitachi High-Technologies S-2600H
- Model: S-2600H
With EMAX Device name: Scanning electron microscope (SEM)
Tokyo, Japan
2002 Hitachi High-Tech Hitachi High-Tech S-3500N
- Model: S-3500N
emax failure Device name: Scanning electron microscope (SEM)
Tokyo, Japan
Hitachi S-2600H
- Manufacturer: Hitachi
- Model: S-2600H
Device name: Scanning electron microscope (SEM) | Remarks: PC startup not possible
Tokyo, Japan- Trusted Seller
Oxford Instruments INCAx-Act Energy Dispersive ED Spectrometer System Parts Lab
- Manufacturer: Oxford
Oxford Instruments INCAx-Act Energy Dispersive Spectrometer System This system was removed from a university where it was surplus to requirement. It powers on and is in good cosmetic condition, we are unable to t...
- Trusted Seller
JEOL PS UNIT(3) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare
- Manufacturer: Jeol
“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System.” JEOL PS UNIT(3) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare Inventory # CONF-1159 Removed from a JE...
$610 USDAlbuquerque, NM - Trusted Seller
JEOL PS UNIT(7) Power Supply JWS-7555S Wafer Defect Review SEM Working Spare
- Manufacturer: Jeol
“Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The unit is missing some hold down screws (see photos).” JEOL PS UNIT(7) Power Supply JWS-7555S Wafer Defect Review SEM ...
$508 USDAlbuquerque, NM
