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2010 Zeiss Merlin
- Manufacturer: Zeiss
- Model: MERLIN
Manufacturer Zeiss Model Merlin Year of Manufacture 2010 Tool Status Connected Wafer Size NA Fab Section Failure Analysis Asset Description Zeiss Merlin Scanning Electron Microscope Software Version Window...
United States - Trusted Seller
Deben Cool Stage LEO-1400VP for Scanning Electron Microscope Lab
- Manufacturer: Deben
Deben Cool Stage LEO-1400VP for Scanning Electron Microscope Lab This item was removed from a facility where it was surplus to requirement. It is in good cosmetic condition and in good working order. This item wa...
$1,355 USDScotland, United Kingdom - Trusted Seller
2002 Hitachi S 5200 Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: S-5200
SEM - Cold FE-Tip, Two SE Detectors - TMP Pumping System - Windows Control System - Oxford EDS System 2002 Vintage
United States - Trusted Seller
Keysight / Agilent / HP N9320B
- Manufacturer: Agilent - Keysight
- Model: N9320B
- High frequency limit: 3 GHz
- Maximum resolution bandwidth: 1 MHz
Professional performance for spectrum analysis from 9 kHz to 3 GHz Minimum non-zero span sweep time: < 10 ms Resolving power RBW: 10 Hz to 1 MHz Sensitivity DANL: -130 dBm, -148 dBm with preamp on Overall amplitu...
New Smyrna Beach, FL - Trusted Seller
1998 Hitachi S 5200
- Manufacturer: Hitachi
- Model: S-5200
Hitachi S 5000 Field Emission Scanning Electron Microscope (SEM) Working condition. - Ultra high resolution 1998 Vintage
United States - Trusted Seller
2001 HITACHI S-9220
- Manufacturer: Hitachi
- Model: S-9220
The tool is complete with no known issues OEM Model Description The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and developm...
United States 
Agilent/Keysight N9320A
- Manufacturer: Agilent - Keysight
- Model: N9320A
The N9320A provides fast and easy measurements for consumer electronics manufacturing test applications. The N9320A offers: Fast measurement speed – best for mass production manufacturing tests, service and repai...
- Trusted Seller
HITACHI S-3400N Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: S-3400N
The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...
United States - Trusted Seller
JEOL MAG PWR AMP Magnet Power Amplifier Assembly AP002207(01) JWS-2000 Working
- Manufacturer: Jeol
“Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System.” JEOL MAG PWR AMP Magnet Power Amplifier Assembly AP002207(01) JWS-2000 Working Inventory # CONF-1309 Removed from a JEOL...
$1,010 USDAlbuquerque, NM - Trusted Seller
JEOL MAG PWR AMP Magnet Power Amplifier Assembly AP002207(01) JWS-7555S Working
- Manufacturer: Jeol
“Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System.” JEOL MAG PWR AMP Magnet Power Amplifier Assembly AP002207(01) JWS-7555S Working Inventory # CONF-1124 Removed from a JE...
$1,008 USDAlbuquerque, NM - Trusted Seller
Oxford Instruments INCA X-Stream & INCA MICS Microanalysis System Lab
- Manufacturer: Oxford
This item has just arrived in our stock. Please enquire for further details.
Wales, United Kingdom - Trusted Seller
2021 AMAT VeritySEM 2 Available
- Manufacturer: Amat
- Model: VeritySEM
APPLIED MATERIALS VeritySEM 2 CD-SEM system - Installed, was just put into idle by OEM - 2021 Vintage - Configured for 200 mm - Equipment was safely decontaminated - The electrical system is fully functional - U...
United States 
Lannion, France
Warsaw, Poland- Trusted Seller
HITACHI SU-70
- Manufacturer: Hitachi
- Model: SU70
Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Sc...
United States
