Used sem

Leo 435VP SEM with Oxford 7636 EDX

• Manufacturer: LEO

Still installed in Lab Complete and working condition Working Video available on request The LEO 435 Variable Pressure SEM offers high-performance with a resolution of 4 nm. Its 5 axis computer controlled stage i...

Applied Materials Verify 4i CD SEM 300mm

• Manufacturer: Amat

Applied Materials, Verify 4i CD SEM 300mm

• Manufacturer: Amat

HITACHI S-9260A 8 05-Mar CD SEM

• Manufacturer: Hitachi
• Model: S-9260A

HITACHI S-9260A 8″ 05-Mar CD SEM

HITACHI S-7800HSA 68 1996 CD SEM

• Manufacturer: Hitachi
• Model: S-7800HSA

HITACHI S-7800HSA 6″,8″ 1996 CD SEM

SELA EM2 Automated TEM and SEM sample preparation system

• Manufacturer: SELA

SELA EM2 Automated TEM and SEM sample preparation system

HITACHI S-7800HSA 68 199704 CD SEM

• Manufacturer: Hitachi
• Model: S-7800HSA

HITACHI S-7800HSA 6″,8″ 1997.04 CD SEM

HITACHI S-9220 8 CD SEM with VIPS METROLOGY

• Manufacturer: Hitachi
• Model: S-9220

HITACHI S-9220 8″ CD SEM with VIPS METROLOGY

Amray Inc 3800c SEM Defect Review DR

• Manufacturer: Amray

Amray, Inc. 3800c SEM – Defect Review (DR) 200mm

1997 Hitachi S-4500 Type 11

• Manufacturer: Hitachi
• Model: S-4500

Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...

Applied Materials VeritySEM 3 SEM Critical Dimension CD Measurement

• Manufacturer: Amat
• Model: VeritySEM

Applied Materials VeritySEM 3 SEM – Critical Dimension (CD) Measurement 300mm

Applied Materials VeritySEM 3 SEM Critical Dimension CD Measurement

• Manufacturer: Amat
• Model: VeritySEM

Applied Materials VeritySEM 3 SEM – Critical Dimension (CD) Measurement 300mm

200mm Inspection SEM KLA-TENCOR eS20XP

• Manufacturer: KLA-Tencor

200mm Inspection SEM – KLA-TENCOR ‘eS20XP’

Applied Materials SEMVision ADC Server SEM Defect Review DR

• Manufacturer: Amat
• Model: Semvision

Applied Materials SEMVision ADC Server SEM – Defect Review (DR)

Applied Materials VeritySEM 2 SEM Critical Dimension CD Measurement

• Manufacturer: Amat
• Model: VeritySEM

Applied Materials VeritySEM 2 SEM – Critical Dimension (CD) Measurement 300mm