Witec Alpha 500ACS Scanning Nearfield and AFM microscope with large scanning stage
used
WITEC ALPHA 500ACS sn 130-1400-354 SOLD "as is" without warranty. EquipX does not have the ability to test this instrument WITec, specialist in high resolution optical and scanning probe microscopy, introduces t...
Agilent/Keysight N9418S
used
- Manufacturer: Agilent - Keysight
The Keysight 9500 Scanning Probe Microscope/Atomic Force Microscope seamlessly and revolutionarily integrates a new software, a new high-bandwidth digital controller, and a state-of-the-art mechanical design to p...
Farmingdale, NJ- Trusted Seller
Nanbei Atomic Force Microscope
new
- Manufacturer: Nanbei
AFM1000 Atomic Force Microscope Brief introduction of Atomic force microscope : Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, includ...
Zhengzhou, China - Trusted Seller
Nanbei Multimode Atomic Force Microscope
new
- Manufacturer: Nanbei
Feature of Multimode Atomic Force Microscope: ◆ The laser detection head and the sample scanning table are integrated, stable and reliable; ◆ Precision laser and probe positioning device, easy to replace the pr...
Zhengzhou, China - Trusted Seller
Microscopes for sale
used
- Manufacturer: Brooks, Leitz, Lam, AMAT, Olympus, Ultratech
Microscope OEM TOOL TYPE # of Units TARA PART # PART NAME Part Number BROOKS AUTO RETICLE MACRO INSPECTION 1 100901 LASER MICROSCOPE 1LM21 1LM21 LEITZ ERGOPLAN 1 104023 LEITZ ERGOPLAN WAFER INSPECTION MICROSCOPE ...
Trim, Ireland - Trusted Seller
Nanbei afm microscope
new
- Manufacturer: Nanbei
Feature of Multimode Atomic Force AFM Microscope ◆ The laser detection head and the sample scanning table are integrated, stable and reliable; ◆ Precision laser and probe positioning device, easy to replace the...
Zhengzhou, China 
Veeco Atomic Force Microscope Probe Head FOR PARTS (8493)R
used
- Manufacturer: Veeco - Sloan
Veeco Atomic Force Microscope Probe Head FOR PARTS (8493)R For Parts. In good cosmetic condition. Has a few scuff marks. This item was taken out of an Atomic Force Microscope. Any information additional informati...
$300 USDGoleta, CA
2010 Park Systems, XE-150, AFM (Atomic Force Microscope)
used
- Manufacturer: Park Systems
XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) - DESCRIPTION: XY Scan Range 100x100µm2, Z Scan Range 12µm, Noise Level 0.05nm (Max) - CONDITION: Working
Suwon-si, South Korea
MicroTime 200 STED
new
Complete confocal STED system based on inverted microscope body Optical resolution below 50 nm Excitation at 640 nm and optionally with additional lasers at 595 nm and 660 nm Up to 6 truly parallel detection chan...
Berlin, Germany
HORIBA France SAS SignatureSPM
new
- Manufacturer: Horiba
Scanning Probe Microscope with Chemical Signature Enhance AFM with Chemical Identification SignatureSPM is the first microscope built on a multimodal characterization platform, integrating an automated Atomic For...
Kyoto, Japan
HORIBA France SAS SmartSPM
new
- Manufacturer: Horiba
Advanced stand-alone AFM The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most...
Kyoto, JapanMicroscopy: SPM Systems
new
Extremely stable and highly versatile SPM Aarhus 150 SPECS for ultimate near ambient pressure scanning probe microscopy applications The UHV VT SPM system is the most reliable tool to study the structure of condu...
Singapore
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