- Trusted Seller
United States - Trusted Seller
KLA SP1-Classic Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
Equipment Make: KLA-Tencor Equipment Model: SP 1-Classic Type: Inspection Machine Wafer Size: 6" to 8" Equipment Configuration: - 4 stations Open cassette
United States - Trusted Seller
2003 Photon Dynamics SV7550 High Speed Color AOI for Printed Wiring Assemblies
- Manufacturer: Photon Dynamics
Further details in attachment. Equipment/Component Type:High Speed Color AOI Item has scratches and markings along the surface as shown in the pictures due to shipping, handling, and/or use. There is residue fr...
United States - Trusted Seller
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States - Trusted Seller
Micromanipulator 2250 Large Area Panel Prober
- Manufacturer: Micromanipulator
- Model: 2250
Micromanipulator 2250 Large Area Panel Prober Large area flat panel prober with 36"x48" air isolation table, 14.5" x 14.5" stage with quick load feature (16" travel front to back), each 34"x4" platen has indepen...
United States - Trusted Seller
2001 Accretech/TSK UF 200 Prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200
Good working condition - OCR- Hot chuck: 30 to 150- MHF 300 L Manipulator- Software: O/S: V2.15.OS
United States - Trusted Seller
2012 KLA-Tencor Candela CS 10 R Surface Analyzer
- Manufacturer: KLA-Tencor
- Model: Candela CS10
- 50/60 Hz - 1 Phase 2012 Vintage
United States - Trusted Seller
United States - Trusted Seller
United States - Trusted Seller
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States - Trusted Seller
Micromanipulator 6100
- Manufacturer: Micromanipulator
- Model: 6100
Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2 Micromanipulator 6100 manual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck optional probe card holder
United States - Trusted Seller
Signatone CM460-22
- Manufacturer: Signatone
- Model: CM-460-22
Signatone CM460-22 semiautomatic probe station 150mm wafer chuck probe card holder joystick controller XY linear motor drive for chuck manual XY microscope translation Mitutoyo FS60 microscope with fiber l...
United States - Trusted Seller
PLASMOS SD 4003 200mm Automated Ellipsometer AF-750 Lang MCC 12 + MP 4000 As-Is
- Manufacturer: Plasmos
- Part No: SD 4003 - Model No: SD 4000 - Configured for wafers up to 200mm - SD Version: 6.25A - Input: 230V, 50/60Hz - Sold As-Is Included Components - System Control Computer - Lang Controller Part No: MCC 12...
United States - Trusted Seller
Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | ...
United States - Trusted Seller
2007 KLA Candela CS 20 Wafer Inspection
- Manufacturer: KLA-Tencor
KLA Candela CS 20 Wafer Inspection - 1 Phase - 50/60 Hz - 115 V 2007 Vintage
United States 
Agilent - Keysight 16058A Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 16058A
Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.
USA
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