Used processing in Shanghai, China

SBT Semi-Automatic Wafer Ultrasonic Scanning Microscope

• Manufacturer: SBT

Scope of Application 6, 8, 12-inch wafer bonding inspection Equipment Advantages No metal contamination in the system, configured with a miniature environment (FFU) package design Meets Class2 (Class 100) cleanli...

SBT Fully Automated Wafer Ultrasonic Scanning Microscope

• Manufacturer: SBT

Scope of Application Suitable for 6, 8, 12-inch wafer bonding inspection Equipment Advantages Loadport can be interfaced with standard Cassette etc. Wafer-specific Robot for sampling, barcode reading, and sample ...

Ultrasonic scanning microscope Laes610

1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...

Ultrasonic scanning microscope Laes620

1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...

Ultrasonic scanning microscope Laes630

1. Introduction: 1. As China's semiconductor materials industry begins to promote the "Nanniwan Spirit" of domestic manufacturing and self-reliance, it is developing in the direction of refinement, high-end, cutt...

Ultrasonic scanning microscope Laes1300

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic scanning microscope Laes820

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic scanning microscope Laes530

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic scanning microscope Laes520

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic Scanning Microscope Laes500

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic scanning microscope Laes310

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic scanning microscope Laes410

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic Scanning Microscope Laes400

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...

Ultrasonic Scanning Microscope T300

1. Introduction: 1. Ultrasonic scanning microscope detection technology has the characteristics of fast detection speed and no damage to workpieces. It is widely used in medical, petroleum, automobile, semiconduc...

Ultrasonic Scanning Microscope Laes1100

1. Introduction: 1. Ultrasonic scanning microscope (SAM) is a non-destructive testing imaging device that uses ultrasonic waves as a transmission medium. 2. Using high-frequency ultrasonic waves to detect various...