- Trusted Seller
KLA Instruments Power Supply Rack KLA-Tencor AIT Fusion Used Working
used
- Manufacturer: KLA-Tencor
- Model: AIT
“Removed from a KLA-Tencor AIT Fusion UV Darkfield Inspection System.” KLA Instruments Power Supply Rack KLA-Tencor AIT Fusion Used Working Inventory # A-9989 This KLA Instruments Power Supply Rack is used workin...
$508 USDAlbuquerque, NM - Trusted Seller
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
used
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States 
Royce 620 64956
used
- Manufacturer: Royce Instruments
- Model: 620
Royce 620 Multitest Bond Tester. Manufactured 10/2021. The Royce 620 Multitest Bond Tester offers an attractive bond test solution that is midway between the Royce 650 and the Royce 610. It performs all the most ...
- Trusted Seller
KLA-Tencor 0099586-001 Laser Servo Detector KLA Instruments AIT UV Working
used
- Manufacturer: KLA-Tencor
- Model: AIT
KLA-Tencor 0099586-001 Laser Servo Detector KLA Instruments AIT Fusion Working Removed from a KLA-Tencor AIT Fusion UV Dark Field Wafer Particle Inspection System This KLA-Tencor 0099586-001 is used working surpl...
$502 USDAlbuquerque, NM 
Agilent/Keysight 4156B
used
- Manufacturer: Agilent - Keysight
- Model: 4156B
Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both measurement and analysis of measurement res...
- Auction
Fort Wayne, INVisit Auction Website - Trusted SellerMagnolia, TX
- Trusted Seller
Universal GSM Feeder Test Station
used
- Manufacturer: Universal Instruments
Model: 45577702 120 VAC 1.5A 85 PSI .
Magnolia, TX 
Texas Instruments AT 4070 Lead Inspection System Periodic Maintenance kit
used
- Manufacturer: Texas Instruments
Information: Texas Instruments AT 4070 Lead Inspection System Periodic Maintenance kit System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue:...
$49 USDSanta Barbara, CA
Tektronix 4225-RPM-LR^
new
- Manufacturer: Tektronix
- Model: 4225-RPM
The Keithley Instruments Model 4225-RPM and 4225-RPM-LR Remote Preamplifier/Switch Modules are remote amplifiers and automatic switches. The 4225-RPM is a multiplexer switch that automatically switches between pr...
$3,864 USDFarmingdale, NJ
ORYX INSTRUMENTS SYSTEM 700-HMR , ESD-QST M700HMR ESD TESTER
used
- Manufacturer: ORYX INSTRUMENTS
ORYX INSTRUMENTS SYSTEM 700-HMR , ESD-QST M700HMR ESD TESTER System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue: PAYMENT OPTIONS: We accep...
Santa Barbara, CA
Tektronix 4200A-SCS-PK1^
new
- Manufacturer: Tektronix
- Model: 4200
In the 4200A-SCS-PK1 bundle, you should have received the 4200A-SCS Parameter Analyzer with: 4200-SMU medium-power (two) Keyboard with integrated mouse Clarius+ software USB flash drive Power line cord Also, you ...
Agilent/Keysight 4156C
used
- Manufacturer: Agilent - Keysight
- Model: 4156C
The Agilent 4156C Precision Semiconductor Parameter Analyzer is a highly accurate laboratory benchtop solution for advanced device characterization. The 41501B Expander extends your capabilities to 1A/200V and ad...
Agilent/Keysight 4155A
used
- Manufacturer: Agilent - Keysight
- Model: 4155A
The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V sweep measurements with dc or pu...
Tektronix 4200A-SCS
used
- Manufacturer: Tektronix
- Model: 4200
The 4200A-SCS is a customizable and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V characterization. The hi...
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