Used Test & Measurement (Semiconductors)

Trusted Seller
1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States
Trusted Seller
KLA-TENCOR Surfscan 5500
- Manufacturer: KLA-Tencor
- Model: Surfscan 5500
- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, detects 0.2 micron particles - Surface haze detected as low as 0.3 ppm. - Handles high scattering surfaces such as ...
United States
Trusted Seller
Signatone S-M90
- Manufacturer: Signatone
- Model: S-M90
Process Type: Wafer Probes Status of Equipment: De-installed Includes Signatone WL170 RF Manual ProbeStation with SanjSCOPE™ EZ-THERM Lock-In Thermal Imaging System
United States
Trusted Seller
Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer
- Manufacturer: Angstrom
Used, Selling As IS Angstrom SE200BM Spectroscopic Ellipsometer Angstrom AST-DHLS-60-9 ASTBench TFProbe Spectrometer UV-VIS High Power Fiber Light Source Vexta PK266PAA Stepping Motor, 2 Phase, 1.8/Step
United States
Trusted Seller
2008 RUDOLPH NSX 105 Inspection System, 8"
- Manufacturer: Rudolph
- Model: NSX-105
Parts machine 2008 Vintage
United States
Trusted Seller
Rudolph / August NSX 95
- Manufacturer: Rudolph
- Model: NSX-95
Automated Defect Inspection
United States
Trusted Seller
Nikon Optiphot 150 Inspection Microscope
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield and darkfield inspectionÂ stage has 6x6 xy travel 5 place nosepiece with optional motorized rotation CF BD Plan 5x/10x/20x/50x objectives Epi-illuminator ...
United States
Trusted Seller
Signatone CM-465-22
- Manufacturer: Signatone
- Model: CM-465-22
Status of Equipment: De-installed Process Type: Wafer Probes Signatone CM460-22 semiautomatic probe station which includes / SIGNATONE WL210 / Vibration Isolation Table /Monitor Mount, KEITHLEY 2636B SOURCE MET...
United States
Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States
Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States
Trusted Seller
2012 Multitest MT 2168
- Manufacturer: Multitest
- Model: MT2168
Vintage 2012 Condition: like new Test Tool from multitest was rarely used for development project ABC - Excellent Condition (Basically new) - Complete (no missing parts) - No Damages - Fully testing COOLiR2...
United States
Trusted Seller
Advantest T5771 ES
- Manufacturer: Advantest
- Model: T5771ES
Advantest T5771 ES Flash Memory Tester Flash Memory Tester A low-cost and high-throughput test system used in the front-end testing of flash memory that is capable of testing 128 devices simultaneously. The T5...
United States
Trusted Seller
Zeiss LM100
- Manufacturer: Zeiss
- Model: LM100
Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...
United States
Trusted Seller
2004 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL Prober, 300mm, TEL P12XL Prober single foup VIP3A Tool Status Disconnected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober single foup VIP3A Software Version Rby00-R016.02U1 ...
United States
Trusted Seller
2003 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...
United States
Tektronix 371B Test & Measurement (semiconductors)
- Manufacturer: Tektronix
- Model: 371B
Good condition Tektronix 371B Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA