Used Test & Measurement (Semiconductors)

Trusted Seller
KLA Instruments Power Supply Rack KLA-Tencor AIT Fusion Used Working
- Manufacturer: KLA-Tencor
- Model: AIT
“Removed from a KLA-Tencor AIT Fusion UV Darkfield Inspection System.” KLA Instruments Power Supply Rack KLA-Tencor AIT Fusion Used Working Inventory # A-9989 This KLA Instruments Power Supply Rack is used workin...
$508 USD
Albuquerque, NM
Trusted Seller
KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I Used
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I Used Inventory # 16313 This KLA-Tencor Prism Lens with WFR Adjuster Set of 2 GPIO Laser Optics AIT I is used working surplus. The physical ...
$603 USD
Albuquerque, NM
Trusted Seller
Raytex RXP-1200 300mm End Effector Wafer Inspection System Lot of 2 Working
- Manufacturer: Raytex
Raytex RXP-1200 300mm End Effector Wafer Inspection System Lot of 2 Working Model No: 300mm End Effector Reseller Lot of 2 Removed from a Raytex RXP-1200 300mm Wafer Pinhole Inspection System This Raytex RXP-1200...
$803 USD
Albuquerque, NM
Trusted Seller
KLA-Tencor 0597627-004 300mm Wafer Inspection Stage WSTG-KT089-1 WaferSight 1
- Manufacturer: KLA-Tencor
“Removed from a KLA-Tencor 300mm WaferSight 1 Optical Inspection System” KLA-Tencor 0597627-004 300mm Wafer Inspection Stage WSTG-KT089-1 WaferSight 1 Model No: WSTG-KT089-1 Removed from a KLA-Tencor 300mm WaferS...
$3,504 USD
Albuquerque, NM
Trusted Seller
2003 TEL P12XL
- Manufacturer: Tokyo Electron - TEL
- Model: P-12XL
TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description TEL P12XL Prober Software Version Standard CIM SECS GEM Process TEST Main System LA08 Prober 1 Factory Interfa...
United States
Trusted Seller
2022 TEL Precio XL
- Manufacturer: Tokyo Electron - TEL
- Model: Precio
Brand new TEL Precio XL. Delivery taken but never unpackaged/ un crated. Config in images
United States
Trusted Seller
NIKON Optistation 3100 Wafer Inspection System
- Manufacturer: Nikon
- Model: Optistation
Wafer Inspection System
United States
Trusted Seller
KLA Surfscan 6420
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
150 / 200 mm This tool needs refurbishment … it’s missing the blower (but easy to replace) and some part may need to be replaced
United States
Trusted Seller
Rudolph / August NSX 95 Automatic Defect Inspection Machine
- Manufacturer: Rudolph
- Model: NSX-95
Automatic Defect Inspection Machine
United States
Trusted Seller
2001 Accretech/TSK UF 200 Prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200
Good working condition - OCR- Hot chuck: 30 to 150- MHF 300 L Manipulator- Software: O/S: V2.15.OS
United States
Trusted Seller
2012 KLA-Tencor Candela CS 10 R Surface Analyzer
- Manufacturer: KLA-Tencor
- Model: Candela CS10
- 50/60 Hz - 1 Phase 2012 Vintage
United States
Trusted Seller
1987 TENCOR Surfscan 4500 Particle Detection Tool
- Manufacturer: KLA-Tencor
- Model: Surfscan 4500
- Cassette to Cassette Handling of 3” - 6” Wafers - 0.2 micron Particle Size Sensitivity - New HeNe Laser & Power Supply - New 4” Calibrarion Wafer Included - Automatic Calibration - System Calibrated & Demonstra...
United States
Trusted Seller
JEOL JWS-7700 wafer inspection system
- Manufacturer: Jeol
Used WS-75BU, WS-70LCKT/15M
United States
Trusted Seller
Rudolph / August NSX 105
- Manufacturer: Rudolph
- Model: NSX-105
Wafer Inspection System
United States
Trusted Seller
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States
Agilent - Keysight 16058A Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 16058A
Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.
USA