Used Test & Measurement (Semiconductors)

Trusted Seller
2001 Accretech/TSK UF 200 Prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200
Good working condition - OCR- Hot chuck: 30 to 150- MHF 300 L Manipulator- Software: O/S: V2.15.OS
United States
Trusted Seller
2012 KLA-Tencor Candela CS 10 R Surface Analyzer
- Manufacturer: KLA-Tencor
- Model: Candela CS10
- 50/60 Hz - 1 Phase 2012 Vintage
United States
Trusted Seller
1987 TENCOR Surfscan 4500 Particle Detection Tool
- Manufacturer: KLA-Tencor
- Model: Surfscan 4500
- Cassette to Cassette Handling of 3” - 6” Wafers - 0.2 micron Particle Size Sensitivity - New HeNe Laser & Power Supply - New 4” Calibrarion Wafer Included - Automatic Calibration - System Calibrated & Demonstra...
United States
Trusted Seller
JEOL JWS-7700 wafer inspection system
- Manufacturer: Jeol
Used WS-75BU, WS-70LCKT/15M
United States
Trusted Seller
Rudolph / August NSX 105
- Manufacturer: Rudolph
- Model: NSX-105
Wafer Inspection System
United States
Trusted Seller
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States
Trusted Seller
Micromanipulator 6100
- Manufacturer: Micromanipulator
- Model: 6100
Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2 Micromanipulator 6100 manual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck optional probe card holder
United States
Trusted Seller
Nikon Optiphot 300
- Manufacturer: Nikon
- Model: Optiphot 300
Nikon Optiphot 300 with reflected and transmitted light and 10x14 XY stage travel Configured for Reflected and Transmitted Light Brightfield, Darkfield, observation Trinocular Viewing Head 5 place universal n...
United States
Trusted Seller
2012 Advantest T6373 ND3
- Manufacturer: Advantest
- Model: T6373 ND3
Inspection Available Yes Description Working Condition ND3 Test Systems. (2) Available Condition Excellent PIN CONFIGURATION MAINFRAME : 1 ‐ 256 TH1 [CTD ] : 1 ‐ 256 LCD : 1 ‐ 2048 RVS : 1 ‐ 64 DPU CONFIG...
United States
Trusted Seller
2019 TSK UF3000 EX prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
De-Installed. It was in Working Condition. Wafer : 12 Inches. Vintage : 2019. It's complete with HDD and Software included. Configuration : - 12" Nickel Tri-Temp Chucktop - Tokyo Seimitsu Accretech ARTS-HS...
United States
Trusted Seller
Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer
- Manufacturer: Nanometrics
- Model: Nanospec
NanoSpec 8300X Film Thickness Analyzer, Wafer Condition: For parts or not working Contents: Nanometrics 7000-0519, 7200-2161, 7200-2193 Nanometrics 7200-2266 Power Supply J.A. Woollam LPS-400 75W Xenon Ligh...
United States
Trusted Seller
2009 Advantest M6541A
- Manufacturer: Advantest
- Model: M6541
Vintage: 2009 Handler
United States
Trusted Seller
Advantest T2000 LS
- Manufacturer: Advantest
- Model: T2000LS
T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (1) BPS-034491 PMU32 Condition Good Working Condition/Off-Line Configuration T2000LS with (8) BPS-034449X03 800DM’s | (2) BPS-035792 DPS150A | (...
United States
Trusted Seller
2011 KLA Candela 8620 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Candela 8620
- 1 Phase - 50/60 Hz 2011 Vintage
United States
Trusted Seller
2019 Accretech UF3000EX Tri Temp
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
Chiller included Inspection: Yes, Power Off Only Vintage : May-19 OS Ver : S6.39.BT Input : AC 210V Single pulse 12" Nickel Tri-temp Chucktop Standard Z Force Stage OpenFoub Single Wide Loader(125mm Space)...
United States
Agilent - Keysight 16058A Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 16058A
Good condition Agilent - Keysight 16058A Test & Measurement (semiconductors)s available between 1990 and 1995 years. Located in USA and other countries. Click request price for more information.
USA