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2019 TSK UF3000 EX prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000EX
De-Installed. It was in Working Condition. Wafer : 12 Inches. Vintage : 2019. It's complete with HDD and Software included. Configuration : - 12" Nickel Tri-Temp Chucktop - Tokyo Seimitsu Accretech ARTS-HS...
United States - Trusted Seller

KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller

1997 KLA Surfscan 6220
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Equipment Model: Surfscan 6220 Type: Defect Inspection System Wafer Size: 2", 3", 4", 6", 8" Equipment Configuration: - Windows 98 SE - Software Version 4.2 - Previously refurbished in 2016 - La...
United States - Trusted Seller

2001 Accretech/TSK UF 200 Prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF200
Good working condition - OCR- Hot chuck: 30 to 150- MHF 300 L Manipulator- Software: O/S: V2.15.OS
United States - Trusted Seller

2012 KLA-Tencor Candela CS 10 R Surface Analyzer
- Manufacturer: KLA-Tencor
- Model: Candela CS10
- 50/60 Hz - 1 Phase 2012 Vintage
United States - Trusted Seller

NIKON Nikon 4G746-103-2 AIS/BFP Plate NSR System Used Working
- Manufacturer: Nikon
- Model: 4G746-103
United States - Trusted Seller

NIKON Nikon OPTISTATION 7 Automatic Wafer Lithography Inspection System Untested Spare
- Manufacturer: Nikon
- Model: Optistation VII
United States - Trusted Seller

Philips Philips Ruby, Ellipsometer, with Genmark Robotand Aligner, cassette load
- Manufacturer: Philips
200mm Used
United States - Trusted Seller
United States - Trusted Seller

Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working
- Manufacturer: Nikon
- Model No: Inspection Stage Chuck - Removed from a Nikon NRM-3100 300mm Wafer Overlay Measurement System This Nikon 300mm Wafer Inspection Stage Chuck is used working surplus. The physical condition is good, bu...
United States - Trusted Seller

Nikon 4G746-103 AIS/BFP Plate NSR-S307E 300mm DUV Scanning System Used Working
- Manufacturer: Nikon
- Model: 4G746-103
This Nikon G746-103 is used working surplus. The physical condition is good, but there are signs of previous use and handling. Removed from a Nikon NSR-S307E 300mm DUV Scanning System. SPECIFICATIONS - Part No:...
United States - Trusted Seller
United States - Trusted Seller

Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage
- Manufacturer: Veeco - Sloan
- Model: Dimension
Veeco Digital Instruments Dimension Large Sample Scanning Atomic Force microscope, LS-SPM with Nanoscope III controller and LSS large sample scanning stage Nanoscope III SPM and controller LSS large sample scan...
United States - Trusted Seller

Micromanipulator 6100
- Manufacturer: Micromanipulator
- Model: 6100
Micromanipulator 6100 150mm Manual Prober with B&L Microzoom 2 Micromanipulator 6100 manual 6" prober with B&L Microzoom 2 Fiber optic light source and adaptor 5" vacuum chuck optional probe card holder
United States - Trusted Seller

Semiprobe Diced wafer Inspection system
- Manufacturer: Semiprobe
Semiprobe Diced wafer Inspection system with wafer mapping software Semiprobe wafer prober mounted on Newport table Inspects diced wafers mounted on film frames Wafer stage with motorized X,Y and theta Motic ...
United States 
Agilent - Keysight 93000 Test & Measurement (semiconductors)
- Manufacturer: Agilent - Keysight
- Model: 93000
Good condition Agilent - Keysight 93000 Test & Measurement (semiconductors)s manufactured in 2001. Located in USA and other countries. Click request price for more information.
USA
